A delay phase at the beginning of a test is often used for allowing the NIC cards to negotiate the links gracefully.
A ramp up phase quickly and proportionally raises the load to the starting level of a capacity assessment test.
A stair stepping phase incrementally adds load to determine the breaking point of the device under test.
A steady phase stress tests the device under test.
The ramp down phase delays conclusion of the test until all of the work-in-progress has completed.
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